imaging regions or phases of different chemical composition surface topography and analysis of fracture surfaces This type of x-ray production in the sample is the same principle as that of the generation of x-rays used in x-ray diffraction instruments.įigure 1. Detectors in both SEM and TEM instruments collect the characteristic x-rays that are generated from the sample to allow for compositional analysis of the material. In a TEM, the electron beam passes through the sample and produces an image using the transmitted electron beam which contains both diffracted and unscattered electrons. A SEM uses the electrons that are scattered off of the sample surface to produce images of the sample. The electron microscopes also use the many interactions that the electron beam has on the sample (Figure 1) to produce various imaging and diffraction modes that can be used to analyze the material down to the atomic scale. Electron microscopes, such as the scanning electron microscope (SEM) and transmission electron microscope (TEM) are instruments used in the analysis of materials on a scale much smaller than possible by optical microscopy.
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